Volume 7, Issue 4 (12-2007)                   IJPR 2007, 7(4): 205-211 | Back to browse issues page

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Saeideh Rhramezani Sani, Abdollah Morteza Ali. Correlation between surface microstructure and optical properties of porous silicon. IJPR. 2007; 7 (4) :205-211
URL: http://ijpr.iut.ac.ir/article-1-132-en.html
Abstract:   (14446 Views)

  We have studied the effect of increasing porosity and its microstructure surface variation on the optical and dielectric properties of porous silicon. It seems that porosity, as the surface roughness within the range of a few microns, shows quantum effect in the absorption and reflection process of porous silicon. Optical constants of porous silicon at normal incidence of light with wavelength in the range of 250-3000 nm have been calculated by Kramers-Kroning method. Our experimental analysis shows that electronic structure and dielectric properties of porous silicon are totally different from silicon. Also, it shows that porous silicon has optical response in the visible region. This difference was also verified by effective media approximation (EMA).

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Type of Study: Research | Subject: General

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