Volume 14, Issue 4 (Iranian Journal of Physics Research,Winter 2015)                   IJPR 2015, 14(4): 231-240 | Back to browse issues page

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Najafi Ashtiani H, Hadavi M. Electro-optical evaluation of tungsten oxide and vanadium pentoxide thin films for modeling an electrochromic device. IJPR. 2015; 14 (4) :231-240
URL: http://ijpr.iut.ac.ir/article-1-1710-en.html
Department of physics, Velayat University, Iranshahr, Iran , hamednajafi59@yahoo.com
Abstract:   (4587 Views)
In this study, tungsten oxide and vanadium oxide electrochromic thin films were placed in vacuum and in a thickness of 200 nm on a transparent conductive substrate of SnO2:F using the physical method of thermal evaporation. Then they were studied for the optical characteristics in the wavelength range from 400 to 700 nm and for their electrical potentials in the range form +1.5 to -1.5 volts. The films were post heated in order to assess changes in energy gap with temperature, at temperatures120 , 300 and 500°C. Refractive and extinction coefficients and the transition type of films in the visible light range and in the thickness of 200 nm were determined and measured. X-ray diffraction pattern and SEM images and cyclic Voltammetry of layers were also studied. The results of this study due to the deposition of layers, the layer thickness selected, the type of substrate, the range of annealing temperatures and selected electrolyte were in full compliance with the works of other researchers [1,2,3]. Therefore, these layers with features such as crystal structure, refractive and even extinction coefficients in the range of visible light, the appropriate response of chromic switch in the replication potential, good adhesion to the substrate, and the high amount of optical transmition and so on, prove useful to be used in an electrochromic device
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Type of Study: Research | Subject: General

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