Volume 9, Number 4 (Iranian Journal of physics Research, Winter 2010)                   IJPR 2010, 9(4): 329-335 | Back to browse issues page


XML Persian Abstract Print


Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Soyouf Jahromi S, Masoudi S. Effects of interfacial potential smoothness on reflectivity, phase, and polarization of reflected neutrons from magnetic films in neutron reflectometry. IJPR. 2010; 9 (4) :329-335
URL: http://ijpr.iut.ac.ir/article-1-450-en.html

, Saeed_s_jahromi@sina.kntu.ac.ir
Abstract:   (12156 Views)
In the past decades, neutron reflectometry have flourished as an applicable method to the study of thin films. As an example, the type and thickness of an unknown thin film which is mounted on top of a magnetic substratum could be determined by measuring the intensity and polarization of the reflected neutrons from the sample. Neutron reflectometry is based on solving the one dimentional schrödinger equation and determining the reflection coefficient at two distinct boundaries. In this paper by considering three smooth varying potential (linear, eckatrt and error function), we have investigated the effects of continuity of interfacial potential on determination of reflectivity, phase and polarization of reflected neutrons from the sample.
Full-Text [PDF 72 kb]   (2164 Downloads)    
Type of Study: Research | Subject: General

Add your comments about this article : Your username or email:
Write the security code in the box

Send email to the article author


© 2015 All Rights Reserved | Iranian Journal of Physics Research

Designed & Developed by : Yektaweb

تحت نظارت وف بومی آسپا-وف