Iranian Journal of Physics Research

Experimental analysis of charge collection efficiency in semiconductor detectors using the MeV ions induced charge method

Volume 25, Issue 2, Summer 2025, Pages 357-367

https://doi.org/10.47176/ijpr.25.2.22020

Zeinab Sadat Imani, Omidreza Kakuee, Amirabbas Sabouri Dodaran

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