Iranian Journal of Physics Research

The effect of annealing temperature on the characterization and electrical characteristics of NiO/PVC gate dielectric ‎

Volume 21, Issue 2, Summer 2021, Pages 429-434

https://doi.org/10.47176/ijpr.21.2.38691

A Hayati

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Investigation of (111) wafers and comparison with (100) substrates

Volume 12, Issue 1, Spring 2012, Pages 85-89

A Bahari

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