The Physics Society of Iran Iranian Journal of Physics Research 1682-6957 21 1 2021 05 22 A review of synchrotron X-ray radiation spectroscopy and imaging ‎ ‎ A review of synchrotron X-ray radiation spectroscopy and imaging ‎ ‎ 1 22 1669 10.47176/ijpr.21.1.39511 FA Abolfazl Keshtkar Vanashi Hossein Ghasemzadeh Mohammadi Shiravan Afraz Saeid Asghari Zadeh Mohammad Lamei Rashti Mona Haddad Journal Article 2019 11 09 Synchrotron radiation is an advanced polarized and collimated light source with high brilliance and intensity. whereas This radiation has a wavelength range of infrared to the highest-energy x-rays. In this article, we provide a summary of application of x-ray spectroscopy with synchrotron radiation to x-ray spectroscopy. Here we discuss ten types of x-ray techniques include X-ray Powder Diffraction(XRPD), Wide Angle X-ray Scattering (WAXS), Small-Angle X-ray Scattering (SAXS), X-ray fluorescence(XRF), X-ray reflectometry (XRR), Near Edge X-ray Absorption Fine Structure (NEXAFS), X-ray Absorption Near Edge Structure (XANES), Photo Electron Spectroscopy (XPS), X-ray Emission Spectroscopy (XES), and x-ray imaging spectroscopy. These techniques have good potential for characterization of various micro- and nano-materials. Furthermore, some advantages of the use of these techniques are as follows: improving signal to noise ratio, better spatial resolution, and improving data acquisition. Synchrotron radiation is an advanced polarized and collimated light source with high brilliance and intensity. whereas This radiation has a wavelength range of infrared to the highest-energy x-rays. In this article, we provide a summary of application of x-ray spectroscopy with synchrotron radiation to x-ray spectroscopy. Here we discuss ten types of x-ray techniques include X-ray Powder Diffraction(XRPD), Wide Angle X-ray Scattering (WAXS), Small-Angle X-ray Scattering (SAXS), X-ray fluorescence(XRF), X-ray reflectometry (XRR), Near Edge X-ray Absorption Fine Structure (NEXAFS), X-ray Absorption Near Edge Structure (XANES), Photo Electron Spectroscopy (XPS), X-ray Emission Spectroscopy (XES), and x-ray imaging spectroscopy. These techniques have good potential for characterization of various micro- and nano-materials. Furthermore, some advantages of the use of these techniques are as follows: improving signal to noise ratio, better spatial resolution, and improving data acquisition. https://ijpr.iut.ac.ir/article_1669_cdf1035c34ec380218a8cc9a43d438f9.pdf