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<ArticleSet>
<Article>
<Journal>
				<PublisherName>The Physics Society of Iran</PublisherName>
				<JournalTitle>Iranian Journal of Physics Research</JournalTitle>
				<Issn>1682-6957</Issn>
				<Volume>12</Volume>
				<Issue>1</Issue>
				<PubDate PubStatus="epublish">
					<Year>2019</Year>
					<Month>11</Month>
					<Day>26</Day>
				</PubDate>
			</Journal>
<ArticleTitle>Investigation of (111) wafers and comparison with (100) substrates</ArticleTitle>
<VernacularTitle>Investigation of (111) wafers and comparison with (100) substrates</VernacularTitle>
			<FirstPage>85</FirstPage>
			<LastPage>89</LastPage>
			<ELocationID EIdType="pii">966</ELocationID>
			
			
			<Language>FA</Language>
<AuthorList>
<Author>
					<FirstName>A</FirstName>
					<LastName>Bahari</LastName>
<Affiliation></Affiliation>

</Author>
</AuthorList>
				<PublicationType>Journal Article</PublicationType>
			<History>
				<PubDate PubStatus="received">
					<Year>2019</Year>
					<Month>11</Month>
					<Day>26</Day>
				</PubDate>
			</History>
		<Abstract> In the last decade, Si(100) has been used as a suitable substrate in field effect transistors. Some issues such as leakage current and tunneling current through the ultrathin films have been increased with shrinking the electronic devices – particularly, field effect transistors – to nanoscale, which is threatening more use of Si(100). We have thus demonstrated a series of experiments to grow ultrathin films on both Si(100) and Si(111) substrates and studied their nanostructural properties to see the possibility of replacing Si(100) with Si(111). The obtained results indicate that Si(111) substrate with silicon nitride film on top is desirable.</Abstract>
			<OtherAbstract Language="FA"> In the last decade, Si(100) has been used as a suitable substrate in field effect transistors. Some issues such as leakage current and tunneling current through the ultrathin films have been increased with shrinking the electronic devices – particularly, field effect transistors – to nanoscale, which is threatening more use of Si(100). We have thus demonstrated a series of experiments to grow ultrathin films on both Si(100) and Si(111) substrates and studied their nanostructural properties to see the possibility of replacing Si(100) with Si(111). The obtained results indicate that Si(111) substrate with silicon nitride film on top is desirable.</OtherAbstract>
		<ObjectList>
			<Object Type="keyword">
			<Param Name="value">nanotransistors</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">gate dielectric</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">Silicon substrate</Param>
			</Object>
			<Object Type="keyword">
			<Param Name="value">photoemission spectroscopy techniques</Param>
			</Object>
		</ObjectList>
<ArchiveCopySource DocType="pdf">https://ijpr.iut.ac.ir/article_966_4e0cb6fb5fb446d1c92ede2ed8780188.pdf</ArchiveCopySource>
</Article>
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