Volume 10, Issue 4 (Iranian Journal of Physics Research, Winter 2011)                   IJPR 2011, 10(4): 281-285 | Back to browse issues page

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Khanlary M, Ahmadi N. Investigation of ZnS thin layers by thermal evaporation method (PVD). IJPR. 2011; 10 (4) :281-285
URL: http://ijpr.iut.ac.ir/article-1-593-en.html
Abstract:   (19443 Views)
Thin layers of ZnS in two different temperature conditions of 25 or 2000C and also with different thicknesses from 100nm to 600nm were prepared by physical vapor deposition. Absorption and also transmission spectra of the films were obtained to determine absorption coefficient, extinction constant and optical band gap of the films. It was found that by decreasing the substrate temperature or decreasing the film's thickness, optical band gap of ZnS films were increased or decreased, respectively. These phenomena can be attributed to the quantum size effect.
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Type of Study: Research | Subject: General

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