Beam profile measurement of ES-200 using secondary electron emission monitor

Ebrahimi Basabi, E; Feghhi, A H; Nikhbakht, M; Shafiee, M

doi:10.18869/acadpub.ijpr.15.2.253

Beam profile measurement of ES-200 using secondary electron emission monitor

Authors

E Ebrahimi Basabi

A H Feghhi

M Nikhbakht

M Shafiee

https://doi.org/10.18869/acadpub.ijpr.15.2.253

Abstract

Up to now, different designs have been introduced for measurement beam profile accelerators. Secondary electron emission monitors (SEM) are one of these devices which have been used for this purpose. In this work, a SEM has been constructed to measure beam profile of ES-200 accelerator, a proton electrostatic accelerator which is installed at SBU. Profile grid for both planes designed with 16 wires which are insulated relative to each other. The particles with maximum energy of 200 keV and maximum current of 400 μA are stopped in copper wires. Each of the wires has an individual current-to-voltage amplifier. With a multiplexer, the analogue values are transported to an ADC. The ADCs are read out by a microcontroller and finally profile of beam shows by a user interface program

Keywords

beam diagnostic

SEM

electrostatic accelerator

1. P Strehl, “Beam Instrumentation and Diagnostics”, Chap 4, (2006) 105.
2. Peter Forck, “Lecture Notes on Beam Diagnostic and Instruments”, Joint University Accelerator School, (2011) 78.
3. J Camas, G Ferioli, J J Gras, R Jung, “Screens Versus SEM Grids”, DIPAC,Travemunde (1995).
4. D Belver et al., “Design And Mesurement Of A Test Stand For The Sem-Gird System Of The Ess-Bilbao”, Proceeding of IPAC2012, New Orleans, Louisiana, USA (2012).
5. L Bernard, et al., “Wide Dynamic Range Beam Position and Profile Measurement for the CERN LEAR”, PAC, Santa Fe )1983(.
6. J Rahighi, M Jafarzadeh Khatibani, S M Sadati, H Ghods, Journal of Nuclear Sci. and Tech 57 (2011)
7. www.srim.org
8. B Denise Pelowitz, “MCNPX User\'s Manual, Version 2.6.0”, Los Alamos National Laboratory (2008).