Volume 15, Issue 2 (Iranian Journal of Physics Research,summer( proceedings ) 2015)                   IJPR 2015, 15(2): 253-258 | Back to browse issues page

DOI: 10.18869/acadpub.ijpr.15.2.253

XML Persian Abstract Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Ebrahimi Basabi E, Feghhi A H, Nikhbakht M, Shafiee M. Beam profile measurement of ES-200 using secondary electron emission monitor. IJPR. 2015; 15 (2) :253-258
URL: http://ijpr.iut.ac.ir/article-1-1847-en.html

Department of Radiation Application, Shahid Beheshti University, G. C, Evin, Tehran , a.feghhi@gmail.com
Abstract:   (2284 Views)
Up to now, different designs have been introduced for measurement beam profile accelerators. Secondary electron emission monitors (SEM) are one of these devices which have been used for this purpose. In this work, a SEM has been constructed to measure beam profile of ES-200 accelerator, a proton electrostatic accelerator which is installed at SBU. Profile grid for both planes designed with 16 wires which are insulated relative to each other. The particles with maximum energy of 200 keV and maximum current of 400 μA are stopped in copper wires. Each of the wires has an individual current-to-voltage amplifier. With a multiplexer, the analogue values are transported to an ADC. The ADCs are read out by a microcontroller and finally profile of beam shows by a user interface program
Full-Text [PDF 548 kb]   (690 Downloads)    
Type of Study: Research | Subject: General

Add your comments about this article : Your username or Email:
Write the security code in the box

Send email to the article author

© 2015 All Rights Reserved | Iranian Journal of Physics Research

Designed & Developed by : Yektaweb

تحت نظارت وف بومی آسپا-وف