Analysis of influence of wall defect in lithium niobate ridge waveguide

Dehghan Nayeri, Hadi; Asadi, Reza; Malek Mohammad, Mohammad

doi:10.18869/acadpub.ijpr.17.1.61

Analysis of influence of wall defect in lithium niobate ridge waveguide

Authors

Hadi Dehghan nayeri

Reza Asadi

Mohammad Malek Mohammad

https://doi.org/10.18869/acadpub.ijpr.17.1.61

Abstract

In this research, the capability of new approach of making ridge waveguides in lithium niobate by Argon physical etching and diffusion of titanium is investigated. For this purpose, the proportion of light mode confinement in the ridge section is measured and compared to simulation results. Also the effect of ridge wall defects -which is a challenge of this kind of waveguides- in light power dissipation, is simulated. The ridge height reaches 2.5µm and the defects of ridge walls are measured to be about 200nm on average. In this research, by simulation of titanium diffusion and refractive index change of the waveguide it is demonstrated that although the defects exist in the ridge walls, by using appropriate diffusion depth of titanium and refractive index distribution, light power dissipation less than 3 dB/cm can be reached while mode confinement in the ridge section is more than 50 percent.

Keywords

Lithium niobate

ridge waveguide

defect

titanium diffusion

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