Characterization of EUV and Soft X-ray emitted by plasma produced in a nanosecond laser field using AXUV Photo-Diode detector

Morshedian, N; Farahbod, A H

doi:10.47176/ijpr.19.4.15204

Characterization of EUV and Soft X-ray emitted by plasma produced in a nanosecond laser field using AXUV Photo-Diode detector

Document Type : Original Article

Authors

N Morshedian

A H Farahbod

The Institute of Plasma and Fusion is available, the Institute of Science and Technology available, Iran

https://doi.org/10.47176/ijpr.19.4.15204

Abstract

Using AXUV (absolute extreme ultraviolet) photodiode, experimental results obtained for soft X-ray and EUV emission are presented. Plasma produced by nanosecond laser pulse laser system is applied with maximum energy of 250 mJ, pulse durations, 10-30 ns and wavelength, 1064 nm under interaction with steel-316 target. The energy of soft X-ray is observed to be approximately linearly proportional to the laser pulse energy. The soft X-ray and EUV emissions with specific signal was detected by AXUV photodiode with durations of about 15 ns and time delay about 20 ns relative to the laser pulse. The average energy conversion efficiency emission was determined to be about 2.5%.

Keywords

AXUV photodiode

EUV emission

Soft X-ray

laser produced plasma

laser energy conversion efficiency

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