Document Type : Original Article
Authors
1 Department of Physics, Faculty of science,Yadegar-e-Imam Khomeini (RAH) Shahre Rey Branch, Islamic Azad University, Tehran, Iran
2 Department of Physics, Faculty of science, Maybod Branch, Islamic Azad University, Maybod, Iran
Abstract
The transfer matrix method adopted to solve the linearly polarized light propagation problem in order to study the occurrence of absorption transitions for Aluminum zigzag thin films. For different incident light, azimuthal angles, arms number and lengths, the optical results showed that the intensity of absorption peak of s-polarization remains constant as the incident light angle increases, while the intensity of absorption peaks for p-polarization increases. According to the variations of spectra for different azimuthal angles, the results of p-polarization are opposite to s polarization. Also, changing the number of arms from two to three, three to four and four to five, shift the peaks of absorption spectrum towards longer (red shift), shorter (blue shift) and longer wavelengths (red shift), respectively. This behavior can be observed for zigzag nano-structure with different arm lengths.
Keywords
- S B Mansoor and B S Yilbas, Opt. Laser Technol 101 ( 2018) 107.
- G Beck and S Funk, Surf. Coat. Technol 206 (2012) 2371.
- M L Green, R A Levy, R G Nuzzo, and E Coleman, Thin Solid Films 114 (1984) 367.
- D Vandembroucq, A Tarrats, J J Greffet, S Roux, and F Plouraboué, Opt.Commun 187 (2001) 289.
- C H Cheung, A B Djuriši´c, C Y Kwong, H L Tam, K W Cheah, Z T Liu, W K Chan, P C Chui, J Chan, A D Raki´c, Opt. Commun 248 (2005) 287.
- D Nieto, F Cambronero, M T F Arias, N Farid, and G M O'Conno, Optics and Lasers in Engineering 88 (2017) 233.
- G S Rohrer, X Liu, J Liu, A Darbal, M N Kelly, X Chen, M A Berkson, N T Nuhfer, K R Coffey, and K Barmak, J. Mater. Sci 52 (2017) 9819.
- X Yu-Qing, L Xing-Cun, C Qiang, L Wen-Wen, Z Qiao, S Li-Jun, L Zhong-Wei, W Zheng-Duo, and Y Li-Zhen, Chin. Phys. B 21 ( 2012) 78.
- C S Oh, J S Bae, S H Choa, H J Lee, “Proceedings of the 13th International Conference on Experimental Mechanics”, Alexandroupolis, Greece, 1–6 July; Springer, Berlin, Germany (2007).
10. G Kaune, E Metwalli, R Meier, V Körstgens, K Schlage, S Couet, R Röhlsberger, S V Roth, and P Müller-Buschbaum, ACS. Appl. Mater. Interfaces. 3 (2011) 1055.
11. A Ziashahabi and R Poursalehi, Materials Science 11 (2015) 743
12. D Vick, T Smy, and M J Brett, J. Mater. Res 17 (2002) 2904.
13. D Vick, L J Friedrich, S K Dew, M J Brett, K Robbie, M Seto et al, Thin Solid Films 88 (1999)339.
14. I J Hodgkinson and P W Wilson, CRC Crit. Rev. Solid State Mater. Sci 15 (1988) 27.
15. H van Kranenburg, J C Lodder, Y Maeda, L Toth and J A Pompa , IEEE Trans. Magn 26 (1999) 1620.
16. K Robbie, PhD Thesis, Alberta: University of Alberta )1998).
17. T Motohiro and Y Taga, Appl. Opt 28 (1989) 2466.
18. J Q Xi, M F Schubert, J K Kim, E F Schubert, M F Chen, S Y Lin et al, Nat. Photon. 1 (2007)176.
19. K Kaminska and K Robbie, Appl. Opt. 43 (2004) 1570.
20. A Lakhtakia and R Messier, Sculptured thin films: nanoengineered morphology and optics (SPIE press, Vol. 122,USA, 2005) Section 9.3.
21. I J Hodgkinson and Q H Wu, Appl. Phys. Lett. 74 (1999) 1794.
22. A J McPhun, Q H Wu and I J Hodgkinson, Electron. Lett. 34 (1998) 360.
23. S Z Rahchamani, H R Gholipour Dizjani, M H Ehsani, Applied Surface Science 356 (2015) 1096.
24. S Z Rahchamani, H R Gholipour Dizjani, and M H Ehsani, Bull. Mater. Sci. (2016).
25. Susann Liedtke, Christoph Grüner, W Jürgen, Beilstein J. Nanotechnol. 9 (2018) 954.
26. H. Savaloni, A. Esfandiar, Appl. Surf. Sci. 257 (2011) 9425.
27. F Babaei, J. Mod. Opt. 60 (2013) 1370.
28. P Vukusic, R Kelly and I Hooper, J R Soc. Interface, 6 (2009) S193.
29. S A Jewell, P Vukusic and N W Roberts, N. J. Physics 9 (2007) 99.
30. M Born, E Wolf, “Principles of Optics”, Cambridge University Press, Cambridge (1999 ).
31. A Thelen, J. Opt. Soc Am. 53 (1963) 1266.
32. M Hoseini Farzad, N yazdanpanah, Iran. J. Phys. Res. 9, 4 (2009) 349.
33. S Roshanentezar, A Rahmatnezamabad, H Afkhami, and B Rahmatnezamabad, Iran. J. Phys. Res. 14, 2 (2014)139.
34. J A Sherwin, A Lakhtakia, B Michel, Opt. Commun. 178 (2000) 267.
35. A Lakhtakia, Mod Simul. Mater. Sci. Eng. 8 (2000) 677.
36. J A Sherwin, A Lakhtakia, and I J Hodgkinson, Opt. Commun 209 (2002) 369.
37. E D Palik, “Handbook of optical constants of solids“. Academic press, NewYork (1985).
38. F Babaei, J. Mod. Opt. 58 (2011) 1292.
39. R N Tait, T Smy, M J Brett, Thin Solid Films. 226 (1993) 196.
40. B Dick, M J Brett, T Smy, and JVac. Sci Technol B Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 21 (2003) 21.
41. S V Kesapragada, P Victor, O Nalamasu, D Gall, Nano Lett 6 (2006) 854.
42. F Babaei, H Savaloni, J. Mod. Opt. 55 (2008) 1845.
43. H Savaloni,F Haydari-Nasab, and M Malmir, Appl. Surf. Sci. 257 (2011) 9044.
)