Effect of substrate temperature on the structural, optical, electrical, and morphological properties of zinc oxide thin films

Souad, Dif; Benramache, Said; Ammari, Abdelfateh; Gahtar, Abdelouahab

doi:10.47176/ijpr.22.3.01590

Effect of substrate temperature on the structural, optical, electrical, and morphological properties of zinc oxide thin films

Document Type : Review Article

Authors

Dif Souad ¹

Said Benramache ²

Abdelfateh Ammari ³

Abdelouahab Gahtar ⁴

¹ Department of Materials Sciences, Faculty of Sciences, University of Biskra, Algeria.

² Department of Materials Sciences, Faculty of Sciences, University of Biskra, Algeria

³ Department of Physics, Faculty of Matter Sciences, University of Tiaret, Algeria Laboratory of Micro and Nanophysics (LaMiN), National Polytechnic School of Oran (ENPO), Oran, Algeria

⁴ Department of Biology, Faculty of Sciences, University of Hamma Lakhdar, El Oued, Algeria

https://doi.org/10.47176/ijpr.22.3.01590

Abstract

The present paper reports on the effect of substrate temperature on the physical properties of zinc oxide (ZnO) thin films deposited using spray-pyrolysis technique. The films exhibit a polycrystalline nature with a preferred orientation along [002]. Furthermore, the average crystallites size increases with increasing the substrate temperature. The scanning electron microscopy results showed that the films were evenly distributed and homogeneous. The average optical transmittance varies in the range of 62 to 90% depending on the substrate temperature. On the other hand, with increasing the substrate temperature, the absorption coefficient decreases and the optical band gap varies in the range of 3.25 - 3.28 eV. The electrical conductivity of films varies between 18 and 58 mS.cm^-1.

Keywords

ZnO thin films

substrate temperature

spray-pyrolysis

morphology

optical band gap

electrical conductivity

20.1001.1.16826957.1401.22.3.17.1

Subjects

Nanomaterials

P E Agbo and M N Nnabuchi, Chalcogenide Lett. 8 (2011) 273.
F Atay, et al., J. Phys. 27 (2003) 285.
Z B Bahşi and A Y Oral, Mater. 29 (2007) 672.
M Baradaran, et al., Alloys Compd. 788 (2019) 289.
S Benramache, et al., Semicond. 34 (2013) 113001.
R Boughalmi, et al., Sci. Semicond. Process. 26 (2014) 593.
R Boughalmi, et al., Chem. Physic. 163 (2015) 99.
A Boukhachem, et al., Actuators A: Phys. 253 (2017) 198.
S H Cho, Electr. Electron. Mater. 10 (2009) 185.
B D Cullity, “Elements of X-ray Diffraction”, Addison-Wesley Publishing, (1956).
A Gahtar, et al., Mater. Sci. 20 (2020) 36.
A Gahtar, et al., Chalcogenide Lett. 19 (2022) 103.
A Gahtar, et al., Nano-Metal Chem. 52 (2022) 112.
A Goktas, et al., Alloys Compd. 893 (2022) 162334.
A Hafdallah, et al., Alloys Compod. 509 (2011) 7267.
Y Huang, et al., Mater. Chem. C 8(2020) 12240.
M R Islam, et al., Interfaces 16 (2019) 120.
A Jiamprasertboon, et al., ACS Appl. Electro. Mater. 1 (2019), 1408.
R Karthikeyan, Doctoral Dissertation Thesis, Shizuoka University (2015).
L H Kathwate, et al., Actuator. A: Phys. 313 (2020) 112193.
H A Kavak, et al., Vacuum 83, 3 (2008) 540.
Z N Kayani, F Saleemi, and I Batool, Phys. A 119 (2015) 713.
F Khan, W Khan, and S D Kim, Nanomaterials 9, 3 (2019) 440.
V Kumar, et al., Phys. B: Condens. Matter 552 (2019) 221.
Y Lu, et al., Inter. J. Appl. Ceram. Techno. 17, 2 (2020) 722.
S Marouf, et al., Mater. Res. 20 (2016) 88.
N Marsi, et al., Inter. J. Nanoelectronics. Mater. 13 (2020) 113.
P Godse, et al., J. Surf. Eng. Mater. and Adv. Technol. 1, 02 (2011) 35.
P Prepelita, et al., Appl. Surf. Sci. 256, 6 (2010) 1807.
A Rahal, S Benramache, and B Benhaoua, J. 18, 2 (2014) 81.
M Riahi, et al., Thin Solid Films 626 (2017) 9.
V Sallet, et al., Nanotechnology 31, 38 (2020) 385601.
T Shen, et al., Appl. Phys. Lett. 120, 4 (2022) 042105.
S S Shinde, et al., Appl. Surf. Sci. 258 (2012) 9969.
D T Speaks, J. Mech. Mater. Eng. 15 (2020) 1.
D Vernardou, et al., J. Crys. Growth 308 (2007) 105.
W Yang, et al., Ceram. Int. 46, 5 (2020), 6605.
Z Zhang, et al., Superlattices and Microstruct. 49, 6 (2011) 644.