Authors
Abstract
Reitveld full profile refinement analysis has been done on Synchrotron diffraction data from a powder sample of YBCOx at RT and 500°C. Anisotropic peak broadening for (h00) and (hh0) lines has been observed by Williamson-Hall (W-H) analysis and that is in agreement with formation of twin's microstructures along (110) crystal planes in the sample. In addition, size and strain of the crystallites has been inferred in our study also.
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