نوع مقاله : مقاله مروری

نویسندگان

1 دانشگاه بین المللی امام خمینی (ره)

2 دانشگاه تبریز

3 سازمان انرژی اتمی ایران

چکیده

تابش سینکروترون، از یک نور قطبی و موازی با درخشندگی خیلی زیاد و شدت بالا تشکیل شده است که شامل ­­­گسترۀ وسیعی از طول موج­ها، از فروسرخ تا پرتوهای X پرانرژی است. در این مقاله خلاصه‌ای از کاربرد‌‌­­­‌‌‌های تابش سینکروترون در طیف‌سنجی‌ و تصویربرداری به کمک پرتو X، ارائه شده است. این کاربرد‌ها شامل پراش پرتو X مواد پودری (XRPD)، پراکندگی پرتو ایکس در زوایای بزرگ (WAXS)، پراکندگی پرتو ایکس در زوایای کوچک (SAXS)، فلورسانس پرتو X (XRF)، بازتاب­سنجی پرتو X (XRR)، جذب لبۀ نزدیک ساختار ظریف پرتو X (NEXAFS)، جذب لبۀ نزدیک ساختار پرتو X (XANES)، طیف‌سنجی فوتوالکترونی پرتو X (XPS)، طیف‌سنجی نشری پرتو X (XES) و تصویر‌برداری به کمک پرتو X است. این تکنیک­ها، برای مشخصه­یابی انواع ساختارهای مواد مختلف در اندازه­های میکرو و نانو توانایی بالایی دارند. علاوه بر این، استفاده از این فناوری‌ها مزیت‌هائی مانند صحت بیشتر اندازه­گیری­ها، بهبود نسبت "علامت به نوفه"، تفکیک فضایی بهتر و  سرعت بیشتر جمع آوری داده­ها دارد.

کلیدواژه‌ها

عنوان مقاله [English]

A review of synchrotron X-ray radiation spectroscopy and imaging ‎ ‎

نویسندگان [English]

  • Abolfazl Keshtkar vanashi 1
  • Hossein Ghasemzadeh mohammadi 1
  • Shiravan Afraz 1
  • Saeid Asghari zadeh 2
  • Mohammad Lamei rashti 3
  • Mona Haddad 1

1

2

3

چکیده [English]

Synchrotron radiation is an advanced polarized and collimated light source with high brilliance and intensity. whereas This radiation has a wavelength range of infrared to the highest-energy x-rays. In this article, we provide a summary of application of x-ray spectroscopy with synchrotron radiation to x-ray spectroscopy. Here we discuss ten types of x-ray techniques include X-ray Powder Diffraction(XRPD), Wide Angle X-ray Scattering (WAXS), Small-Angle X-ray Scattering (SAXS), X-ray fluorescence(XRF), X-ray reflectometry (XRR), Near Edge X-ray Absorption Fine Structure (NEXAFS), X-ray Absorption Near Edge Structure (XANES), Photo Electron Spectroscopy (XPS), X-ray Emission Spectroscopy (XES), and x-ray imaging spectroscopy. These techniques have good potential for characterization of various micro- and nano-materials. Furthermore, some advantages of the use of these techniques are as follows: improving signal to noise ratio, better spatial resolution, and improving data acquisition.

کلیدواژه‌ها [English]

  • synchrotron radiation
  • X-ray spectroscopy
  • X-ray imaging‎ ‎
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