نوع مقاله : مقاله پژوهشی
نویسندگان
کمیسیون انرژی اتمی سوریه
چکیده
لایه ZnS با استفاده از تبخیر گرمایی روی زیرلایه PbS نشانده شده است، لایه ZnS تحت تأثیر PbS ساختار نانو (نانوسیم) پیدا می‌کند، که نقش کاتالیست را دارد. این رشد برای لایه‌های آلاییده نشده ساختاری چگال دارد (برای لایه‌های PbS و ZnS). ریخت‌شناسی با میکروسکوپ الکترونی روبشی SEM از ZnS/PbS، ZnS و PbS به تفصیل مورد بررسی قرار گرفته است (سطح و سطح مقطع). از میکروسکوپی نیروی اتمی (AFM) برای بررسی لایه‌های نازک استفاده شده است (PbS و ZnS). روش‌های بیناب‌سنجی فوتوالکترون پرتوی ایکس (XPS) و EDX برای دانستن ترکیبات شیمیایی و استویکیومتری لایه‌های نشانده شده مورد استفاده قرار گرفته‌اند. رفتار بلورشناختی با استفاده از نقش‌های XRD مورد بررسی قرار گرفتند، و نشان داده شد که نتایج مشخصه‌یابی‌های رامان و XRD در توافق خوبی قرار دارند. برای به دست آوردن تصویری از خواص اپتیکی لایه‌های نازک انباشته روی بستر شیشه‌ای از بیناب‌سنجی UV-Vis استفاده شده است. نانوسیم‌های ZnS و لایه نازک فاز هگزاگونال دارند، که بیانگر لایه میانی است، که ساختار را تحت تأثیر قرار نمی‌دهد، اما سازوکار رشد را تغییر می‌دهد. میکروسکوپ الکترونی عبوری تفکیک بالا (HRTEM) تشکیل نانوسیم‌های ZnS را تأیید می‌کند
کلیدواژه‌ها
عنوان مقاله [English]
Effect of PbS on ZnS nanostructure deposited using thermal evaporation: growth, morphological and structural study
نویسندگان [English]
- B Muhammad Abdalla
- M Kakhia
- A M Obied
- W A Zetoune
Department of Physics, Atomic Energy Commission of Syria, Damascus, Syria
چکیده [English]
ZnS film has been deposited on PbS buffer layer using thermal evaporation, the ZnS film has nanostructure (nanowires) due to effect of PbS which play role of catalyst. This growth for non doped films have dense structure (for PbS and ZnS films). SEM morphology of ZnS/PbS, ZnS and PbS have been studied in details (surface and cross section). Atomic force microscopy (AFM) used to characterized the thins films (ZnS and PbS). X-ray photoelectron spectroscopy (XPS) and EDX techniques have utilized to know the chemical and stoichiometry of deposited films. The crystallographic properties have been studied using XRD patterns, it found that the results in Raman and XRD characterization have a good agreement. UV-Vis spectroscopy is used to acquire an idea about optical properties of thin films deposited on glass substrate. The deposited ZnS nanowires and thin film have hexagonal phase, which indicate to the buffer layer, which does not affects the structural but changes the growth mechanism. High Resolution Transmission Electron Microscope (HRTEM) images have confirmed the formation of ZnS nanowires.
کلیدواژه‌ها [English]
- ZnS Nanowires
- XRD and XPS characterization
- SEM and HRTEM morphology
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